Topics

The 21^st DRIP Conference will be divided into the following thematic sessions:

• Defects in Silicon and Group-IV Semiconductors
• Defects in Wide-Bandgap Semiconductors (SiC, III-nitrides, Ga₂O₃, diamond)
• Defects in Classical III–V Semiconductors
• Defects in Classical II–VI Semiconductors
• Defects in Perovskites and Oxide Semiconductors
• Defects in 2D and Layered Materials
• Defects in Novel Materials
• Quantum and Spin Defects in Semiconductors for Quantum Technologies
• Advanced Techniques for Defect Detection and Imaging
• Artificial Intelligence and Machine Learning in Defect Analysis
• Advanced Modeling and Simulation of Defects